conftrace_

correspondence-free matching

2 papers

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Co-occurring keywords · papers mentioning both

point cloud registration (2) spherical pattern (1) outlier contamination (1) geometric algorithm (1) 3d alignment (1) feature-metric registration (1) rotation estimation (1) outlier detection (1) 3d vision (1)

Papers

Correspondence-Free Fast and Robust Spherical Point Pattern Registration ICCV 2025 Feature-Metric Registration: A Fast Semi-Supervised Approach for Robust Point Cloud Registration Without Correspondences CVPR 2020